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Browsing 2008 Vol: 10 Sayı: 2 by Subject "Scanning Tunneling Microscope (STM)"
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- 2008 Vol: 10 Sayı: 2
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- Browsing 2008 Vol: 10 Sayı: 2 by Subject
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Browsing 2008 Vol: 10 Sayı: 2 by Subject "Scanning Tunneling Microscope (STM)"
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(Sakarya Üniversitesi Fen Edebiyat Fakültesi, 2008)Effect of different anodisation current on porous silicon is investigated by STM (Scanning Tunneling Microscope). Some porous silicon samples were prepared from p-type, boron doped, [100]- oriented silicon wafers with the ...
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