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Dielectric properties of thallium gallium diselenide layered crystal in the incommensurate phase

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dc.contributor.authors Senturk, E; Tumbek, L; Mikailov, FA;
dc.date.accessioned 2020-01-20T08:02:46Z
dc.date.available 2020-01-20T08:02:46Z
dc.date.issued 2005
dc.identifier.citation Senturk, E; Tumbek, L; Mikailov, FA; (2005). Dielectric properties of thallium gallium diselenide layered crystal in the incommensurate phase. CRYSTAL RESEARCH AND TECHNOLOGY, 40, 904-901
dc.identifier.issn 0232-1300
dc.identifier.uri https://hdl.handle.net/20.500.12619/32328
dc.identifier.uri https://doi.org/10.1002/crat.200410455
dc.description.abstract The dielectric measurements of the layered crystal were studied in temperature range of successive phase transitions. The measurements revealed that the phase transition occurred in 242 K is an incommensurate phase transition. When the sample is annealed at a stabilized temperature in the incommensurate phase, a remarkable memory effect has been observed on cooling run. The mechanism of the memory effect in the incommensurate phase of the semiconducting ferroelectric TlGaSe2 can be interpreted in the frame of the theory of defect density waves. This theory claims that the memory effect is the result of pinning of the incommensurate structure by the lattice inhomogeneities. With decreasing the annealing temperature the phase transition temperature shifts to lower temperatures gradually. Moreover, the peak intensities also increase gradually. In addition to these effects, the phase transition temperature shifts to lower temperatures with increasing annealing time. (C) 2005 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
dc.language English
dc.publisher WILEY-V C H VERLAG GMBH
dc.subject Crystallography
dc.title Dielectric properties of thallium gallium diselenide layered crystal in the incommensurate phase
dc.type Article
dc.identifier.volume 40
dc.identifier.startpage 901
dc.identifier.endpage 904
dc.contributor.department Sakarya Üniversitesi/Fen-Edebiyat Fakültesi/Fizik Bölümü
dc.contributor.saüauthor Şentürk, Erdoğan
dc.relation.journal CRYSTAL RESEARCH AND TECHNOLOGY
dc.identifier.wos WOS:000232055100015
dc.identifier.doi 10.1002/crat.200410455
dc.contributor.author Şentürk, Erdoğan


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