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dc.contributor.authors Yener, SC; Frei, S; Scheier, S;
dc.date.accessioned 2020-02-27T07:00:33Z
dc.date.available 2020-02-27T07:00:33Z
dc.date.issued 2016
dc.identifier.citation Yener, SC; Frei, S; Scheier, S; (2016). EMC Europe. PROCEEDINGS OF THE 2016 INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY - EMC EUROPE, , 545-541
dc.identifier.issn 2325-0356
dc.identifier.uri https://hdl.handle.net/20.500.12619/64791
dc.description.abstract Failures in digital devices can be caused by ESD-pulses coupled directly or indirectly to input pins. Weak pulses will not destroy a device but can be interpreted as logical signals (ESD soft failure). In this paper, a modelling and characterization methodology for a microcontroller input is proposed. With this model the ESD soft failure behaviour can be simulated. First a measurement setup for characterization of input behaviour was developed and applied to a commonly used microcontroller. For the digital input an RC model approximation is used and related parameters are extracted. SPICE simulations have been performed and results have been compared with the measurements. It could be shown that the RC model can predict quite well the ESD soft failure behaviour.
dc.language English
dc.publisher IEEE
dc.subject Engineering
dc.title EMC Europe
dc.type Proceedings Paper
dc.identifier.startpage 541
dc.identifier.endpage 545
dc.contributor.department Sakarya Üniversitesi/Mühendislik Fakültesi/Elektrik-Elektronik Mühendisliği Bölümü
dc.contributor.saüauthor Yener, Şuayb Çağrı
dc.relation.journal PROCEEDINGS OF THE 2016 INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY - EMC EUROPE
dc.identifier.wos WOS:000392194100093
dc.contributor.author Yener, Şuayb Çağrı
dc.contributor.author Stephan Frei
dc.contributor.author Stanislav Scheier


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