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Browsing Makale Koleksiyonu by Author "Yener, SC; Frei, S; Scheier, S;"

Browsing Makale Koleksiyonu by Author "Yener, SC; Frei, S; Scheier, S;"

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  • EMC Europe 
    Yener, Şuayb Çağrı; Stephan Frei; Stanislav Scheier (IEEE, 2016)
    Failures in digital devices can be caused by ESD-pulses coupled directly or indirectly to input pins. Weak pulses will not destroy a device but can be interpreted as logical signals (ESD soft failure). In this paper, a ...