Two relaxation mechanisms in (Sr1-1.5xBix)TiO3 (x : 0.0067)

Şentürk, Erdoğan

dc.contributor.authors	Senturk, E;
dc.date.accessioned	2020-01-20T08:02:45Z
dc.date.available	2020-01-20T08:02:45Z
dc.date.issued	2005
dc.identifier.citation	Senturk, E; (2005). Two relaxation mechanisms in (Sr1-1.5xBix)TiO3 (x : 0.0067). SOLID-STATE ELECTRONICS, 49, 939-935
dc.identifier.issn	0038-1101
dc.identifier.uri	https://hdl.handle.net/20.500.12619/32323
dc.identifier.uri	https://doi.org/10.1016/j.sse.2005.03.008
dc.description.abstract	The ceramic samples were prepared by the solid-state reaction. Detailed studies of the real and imaginary part of the dielectric constant of the compound as a function of temperature carried out at low temperatures. The measurements exhibit a ferroelectric phase transition at around 55 K for 10 Hz. Measurements of the real and imaginary part of the dielectric constant have been studied both as a function of frequency in mentioned temperature interval. The two different relaxations with non-Debye type were observed clearly at around the temperature of the dielectric constant maximum. The relaxation times were calculated from the Cole-Cole plot analysis. The dielectric relaxation behaviour has been described by means of Maxwell-Wagner model. (c) 2005 Elsevier Ltd. All rights reserved.
dc.language	English
dc.publisher	PERGAMON-ELSEVIER SCIENCE LTD
dc.subject	Physics
dc.title	Two relaxation mechanisms in (Sr1-1.5xBix)TiO3 (x : 0.0067)
dc.type	Article
dc.identifier.volume	49
dc.identifier.startpage	935
dc.identifier.endpage	939
dc.contributor.department	Sakarya Üniversitesi/Fen-Edebiyat Fakültesi/Fizik Bölümü
dc.contributor.saüauthor	Şentürk, Erdoğan
dc.relation.journal	SOLID-STATE ELECTRONICS
dc.identifier.wos	WOS:000229906500012
dc.identifier.doi	10.1016/j.sse.2005.03.008
dc.identifier.eissn	1879-2405
dc.contributor.author	Şentürk, Erdoğan