The Structural Properties of ZnO Thin Films Produced in Different Molarities by Spin Coating Method

Abstract

In this study, ZnO thin films in various molarities were fabricated on microscope glasses using spin coating method. The films were thermally annealed at 600 A degrees C. Thin films produced at 0.3-2.0 M have been evaluated using X-ray diffraction spectra, scanning electron microscopy (SEM) and the photographs from the side view. From the SEM micrograph, the average thicknesses of the films have been evaluated to be 1.1, 1.7, 3.25, 4, 5 and 13.5 mu m for the molarities of 0.3, 0.5, 0.7, 1, 1.5 and 2 M, respectively. A constant (c) reflecting the adhesion properties of the sol to the substrate has been attained to be 1.5. This coefficient is thought to be strongly dependent on the sol and substrate type as well as the annealing temperature and duration. In these coatings, a curving effect resulting from ZnO thin films has also been observed in the specimen, especially in the higher molarity values.