Browsing by Subject "Taramalı Tünelleme Mikroskobu (STM)"

Now showing items 1-1 of 1

Investigation of Effect of Different Anodisation Current on Porous Silicon By Stm

T. Canel; Y. Bektöre (Sakarya Üniversitesi Fen Edebiyat Fakültesi, 2008)

Effect of different anodisation current on porous silicon is investigated by STM (Scanning Tunneling Microscope). Some porous silicon samples were prepared from p-type, boron doped, [100]- oriented silicon wafers with the ...